Magnetic Alternating Current Imaging AFM

The invention relates to a method for AFM in which it is possible to measure magnetic information from single, isolated magnetic markers in on the scale of nm.The method is used to differentiate between marked and unmarked arrears, for measuring the magnetic AC-susceptibility of the marker and to determinate the geometry of a marker. Hereby the measured signal is further processed by an amplifier.
The method utilises nanoparticles (marker), which are placed on or in a sample. Because of the alternating magnetic field these particles are stimulated to create a magnetic flow, which is dependent on the AC-susceptibility of the particle and on with the external alternat-ing field. With this effect, the entire magnetic flow in the area around the marker is changed. Furthermore, the entire sample is scanned in 2-D or 3-D and differences in the magnetic flow, which generate a magnetic interference, are measured by detecting the oscillation of the AFM tip. This oscillation is the measurement signal, which makes it possible to measure smaller magnetic interac-tions.

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